5799 search results - page 5 / 1160 » Patterns Generate Architectures |
DAC
2003
ACM
14 years 1 months ago
2003
ACM
To improve the system performance, designs with multiple clocks have become more and more popular. In this paper, several novel test generation procedures are proposed to utilize ...
IWPC
1996
IEEE
13 years 12 months ago
1996
IEEE
Mastering the complexity of programs and systems, particularly distributed systems, should lead to signi cant improvements in program and system understanding. In this paper we pr...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Due to shrinking technology, increasing functional frequency and density, and reduced noise margins with supply voltage scaling, the sensitivity of designs to supply voltage noise...
CASES
2007
ACM
13 years 11 months ago
2007
ACM
With increasing complexity of modern embedded systems, the availability of highly optimizing compilers becomes more and more important. At the same time, application specific inst...
DSD
2010
IEEE
13 years 6 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...