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DAC
2006
ACM
14 years 7 months ago
Prototyping a fault-tolerant multiprocessor SoC with run-time fault recovery
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...
Xinping Zhu, Wei Qin
DAC
2003
ACM
14 years 7 months ago
Learning from BDDs in SAT-based bounded model checking
Bounded Model Checking (BMC) based on Boolean Satisfiability (SAT) procedures has recently gained popularity as an alternative to BDD-based model checking techniques for finding b...
Aarti Gupta, Malay K. Ganai, Chao Wang, Zijiang Ya...
DAC
2006
ACM
14 years 7 months ago
Criticality computation in parameterized statistical timing
Chips manufactured in 90 nm technology have shown large parametric variations, and a worsening trend is predicted. These parametric variations make circuit optimization difficult ...
Jinjun Xiong, Vladimir Zolotov, Natesan Venkateswa...
DAC
1994
ACM
13 years 11 months ago
The Design of High-Performance Microprocessors at Digital
Today's high-performance single-chip CMOS microprocessors are the most complex and challenging chip designs ever implemented. To stay on the leading edge, Digital's micro...
Thomas F. Fox
DAC
2005
ACM
13 years 8 months ago
A design platform for 90-nm leakage reduction techniques
Methodology, EDA Flow, scripts, and documentation plays a tremendous role in the deployment and standardization of advanced design techniques. In this paper we focus not only on l...
Philippe Royannez, Hugh Mair, Franck Dahan, Mike W...