1419 search results - page 33 / 284 » Power Droop Testing |
ASPDAC
2012
ACM
12 years 5 months ago
2012
ACM
In this paper, we examine the integration potential and explore the design space of low power thermal reliable on-chip interconnect synthesis featuring nanophotonics Wavelength Di...
VLSID
2004
IEEE
14 years 10 months ago
2004
IEEE
: The accumulation of popular features in portable products such as mobile handsets is driving battery life to unacceptably low levels. Substantial change will not come from increm...
VTS
2005
IEEE
14 years 3 months ago
2005
IEEE
The power supply transient signal (IDDT) method that we propose for defect detection analyze regional signal variations introduced by defects at a set of power supply pads on the ...
ESORICS
1994
Springer
14 years 2 months ago
1994
Springer
The Transformation Model TRM was recently introduced 10 in the literature by Sandhu and Ganta. TRM is based on the concept of transformation of rights. The propagation of access ri...
DATE
2005
IEEE
14 years 3 months ago
2005
IEEE
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in futu...