1419 search results - page 3 / 284 » Power Droop Testing |
CDC
2010
IEEE
13 years 3 months ago
2010
IEEE
This paper is concerned with studying how the minimum power loss in a power system is related to its network topology. The existing algorithms in the literature all exploit nonline...
MA
2011
Springer
13 years 3 months ago
2011
Springer
Let S be a p × p random matrix having a Wishart distribution Wp(n, n−1Σ). For testing a general covariance structure Σ = Σ(ξ), we consider a class of test statistics Th = n...
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
1 This paper presents a test scheduling approach for system-onchip production tests with peak-power constraints. An abort-onfirst-fail test approach is assumed, whereby the test is...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
We present Low Power Illinois scan architecture (LPILS) to achieve power dissipation and test data volume reduction, simultaneously. By using the proposed scan architecture, dynam...
ATS
2004
IEEE
14 years 8 days ago
2004
IEEE
Test data volume and scan power are two major concerns in SoC test. In this paper we present an alternative run-length coding method through scan chain reconfiguration to reduce b...