1419 search results - page 59 / 284 » Power Droop Testing |
ASPDAC
2008
ACM
13 years 11 months ago
2008
ACM
Power dissipation is quickly becoming one of the most important limiters in nanometer IC design for leakage increases exponentially as the technology scaling down. However, power ...
MTV
2006
IEEE
14 years 4 months ago
2006
IEEE
Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, archite...
VTS
2005
IEEE
14 years 3 months ago
2005
IEEE
Testing data retention faults (DRFs), particularly in integrated systems on chip comprised of very large number of various sizes and types of embedded SRAMs is challenging and typ...
ITC
1991
IEEE
14 years 1 months ago
1991
IEEE
In diagnosing a failed system, a smart technician would choose tests to be performed based on the context of the situation. Currently, test program sets do not fault-. isolate wit...
SSIRI
2010
13 years 8 months ago
2010
— Model-based approaches, especially based on directed graphs (DG), are becoming popular for mutation testing as they enable definition of simple, nevertheless powerful, mutation...