: With technology scaling, elevated temperatures caused by increased power density create a critical bottleneck modulating the circuit operation. With the advent of FinFET technolo...
We present a fast, dynamic fault coverage estimation technique for sequential circuits that achieves high degrees of accuracy by signi cantly reducing the number of injected fault...
With increasingly smaller feature sizes and higher on-chip densities, the power dissipation of VLSI systems has become a primary concern for designers. This paper first describes...
—While array structures are a significant source of power dissipation, there is a lack of accurate high-level power estimators that account for varying array circuit implementat...
Mahesh Mamidipaka, Kamal S. Khouri, Nikil D. Dutt,...
Switching activity estimation is a crucial step in estimating dynamic power consumption in CMOS circuits. In [1], we proposed a new switching probability model based on Bayesian N...