296 search results - page 39 / 60 » Power Estimation in Sequential Circuits |
ICCD
1996
IEEE
14 years 4 days ago
1996
IEEE
For circuits where there may be latches with no reset line, we show how to replace some of them with combinational logic. All previous work in sequential optimization by latch rem...
CORR
2002
Springer
13 years 7 months ago
2002
Springer
We demonstrate that the unbounded fan-out gate is very powerful. Constant-depth polynomial-size quantum circuits with bounded fan-in and unbounded fan-out over a fixed basis (denot...
ISQED
2007
IEEE
14 years 2 months ago
2007
IEEE
The deep submicron (DSM) semiconductor technologies will make the worst-case design impossible, since they can not provide design margins that it requires. Research directions sho...
VTS
2002
IEEE
14 years 27 days ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
ICCAD
2008
IEEE
14 years 2 months ago
2008
IEEE
— Dynamic power noises may not only degrade the circuit performance but also reduce the noise margin which may result in the functional errors in integrated circuit. Decoupling c...