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VTS
1996
IEEE
112views Hardware» more  VTS 1996»
13 years 11 months ago
Optimal voltage testing for physically-based faults
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
Yuyun Liao, D. M. H. Walker
ISCAS
2006
IEEE
133views Hardware» more  ISCAS 2006»
14 years 1 months ago
Neuronal ion-channel dynamics in silicon
Abstract— We present a simple silicon circuit for modelling voltagedependent ion channels found within neural cells, capturing both the gating particle’s sigmoidal activation (...
Kai M. Hynna, Kwabena Boahen
DAC
2009
ACM
14 years 8 months ago
Analysis and mitigation of process variation impacts on Power-Attack Tolerance
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
Lang Lin, Wayne P. Burleson
ICCAD
1994
IEEE
117views Hardware» more  ICCAD 1994»
13 years 11 months ago
Optimal latch mapping and retiming within a tree
We propose a technology mapping algorithm that takes existing structural technology-mapping algorithms based on dynamic programming [1,3,4] and extends them to retime pipelined cir...
Joel Grodstein, Eric Lehman, Heather Harkness, Her...
ICCAD
1998
IEEE
105views Hardware» more  ICCAD 1998»
13 years 11 months ago
Fanout optimization under a submicron transistor-level delay model
In this paper we present a new fanout optimization algorithm which is particularly suitable for digital circuits designed with submicron CMOS technologies. Restricting the class o...
Pasquale Cocchini, Massoud Pedram, Gianluca Piccin...