In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
Abstract— We present a simple silicon circuit for modelling voltagedependent ion channels found within neural cells, capturing both the gating particle’s sigmoidal activation (...
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...
We propose a technology mapping algorithm that takes existing structural technology-mapping algorithms based on dynamic programming [1,3,4] and extends them to retime pipelined cir...
Joel Grodstein, Eric Lehman, Heather Harkness, Her...
In this paper we present a new fanout optimization algorithm which is particularly suitable for digital circuits designed with submicron CMOS technologies. Restricting the class o...