3819 search results - page 40 / 764 » Predicting Dependability by Testing |
VTS
2007
IEEE
14 years 2 months ago
2007
IEEE
In this paper, a novel test point insertion methodology is presented for RTL designs that aims to reduce the data volume of scan-based transition delay tests. Test points are iden...
ICCAD
2004
IEEE
14 years 4 months ago
2004
IEEE
— In this paper we investigate an effective approach to construct a linear decompression network in the multiple scan chain architecture. A minimal pin architecture, complemented...
MTV
2007
IEEE
14 years 2 months ago
2007
IEEE
Test vector ordering is recognized as a simple and non-intrusive approach to assist test power reduction. Simulation based test vector ordering approach to minimize circuit transit...
VLSID
2005
IEEE
14 years 8 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
ICST
2009
IEEE
14 years 2 months ago
2009
IEEE
In this paper, we consider typical applications in which the business logic is separated from the access control logic, implemented in an independent component, called the Policy ...