78 search results - page 10 / 16 » ProB: an automated analysis toolset for the B method |
DAC
2004
ACM
14 years 8 months ago
2004
ACM
As technology advances, the metal width is decreasing with the length increasing, making the resistance along the power line increase substantially. Together with the nonlinear sc...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Power gating is one of the most effective ways to reduce leakage power. In this paper, we introduce a new relationship among Maximum Instantaneous Current, IR drops and sleep tran...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Statistical behavior of device leakage and threshold voltage shows a strong width dependency under microscopic random dopant fluctuation. Leakage estimation using the conventional...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Scan-based silicon debug is a technique that can be used to help find design errors in prototype silicon more quickly. One part of this technique involves the inclusion of breakpo...
BMCBI
2007
13 years 7 months ago
2007
Background: The combination of mass spectrometry and solution phase amide hydrogen/deuterium exchange (H/D exchange) experiments is an effective method for characterizing protein ...