305 search results - page 59 / 61 » Process Isolation for Reconfigurable Hardware |
ISCAS
2007
IEEE
14 years 1 months ago
2007
IEEE
- Data in conventional six transistor (6T) static random access memory (SRAM) cells are vulnerable to noise due to the direct access to the data storage nodes through the bit lines...
DATE
2010
IEEE
14 years 22 days ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
DSD
2010
IEEE
13 years 7 months ago
2010
IEEE
—Periodic on-chip scan-based tests have to be applied to a many-core processor SoC to improve its dependability. An infrastructural IP module has been designed and incorporated i...
SASP
2009
IEEE
14 years 2 months ago
2009
IEEE
— As growing power dissipation and thermal effects disrupted the rising clock frequency trend and threatened to annul Moore’s law, the computing industry has switched its route...
FPGA
1995
ACM
13 years 11 months ago
1995
ACM
During the development of computer peripherals which interface to the processor via the system bus it is often necessary to acquire the signals on the bus at the hardware level. I...