885 search results - page 36 / 177 » Process Patterns for COTS-Based Development |
112
click to vote
ECBS
2007
IEEE
15 years 8 months ago
2007
IEEE
Design patterns document expert design experience in software system development. They have been applied in many existing software systems. However, pattern information is general...
102
click to vote
ISQED
2010
IEEE
15 years 9 months ago
2010
IEEE
—Double patterning lithography (DPL) provides an attractive alternative or a supplementary method to enable the 32nm and 22nm process nodes, relative to costlier technology optio...
120
click to vote
DATE
2004
IEEE
15 years 6 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
116
click to vote
WEBIST
2008
15 years 3 months ago
2008
Abstract. Designing and personalising systems for specific user groups encompasses a lot of effort with respect to analysing and understanding user behaviour. The goal of our paper...
126
click to vote
IUSED
2008
15 years 3 months ago
2008
Usability supporting architectural patterns (USAPs) have been shown to provide developers with useful guidance for producing a software architecture design that supports usability...