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VLSID
2008
IEEE
111views VLSI» more  VLSID 2008»
14 years 11 months ago
Power Reduction of Functional Units Considering Temperature and Process Variations
Continuous technology scaling has resulted in an increase in both, the power density as well as the variation in device dimensions (process variations) of the manufactured process...
Deepa Kannan, Aviral Shrivastava, Sarvesh Bhardwaj...
ISVLSI
2008
IEEE
142views VLSI» more  ISVLSI 2008»
14 years 5 months ago
A Fuzzy Approach for Variation Aware Buffer Insertion and Driver Sizing
In nanometer regime, the effects of process variations are dominating circuit performance, power and reliability of circuits. Hence, it is important to properly manage variation e...
Venkataraman Mahalingam, Nagarajan Ranganathan
DAC
2004
ACM
14 years 11 months ago
Statistical optimization of leakage power considering process variations using dual-Vth and sizing
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
Ashish Srivastava, Dennis Sylvester, David Blaauw
ISPD
2006
ACM
108views Hardware» more  ISPD 2006»
14 years 4 months ago
Statistical clock tree routing for robustness to process variations
Advances in VLSI technology make clock skew more susceptible to process variations. Notwithstanding efficient zero skew routing algorithms, clock skew still limits post-manufactu...
Uday Padmanabhan, Janet Meiling Wang, Jiang Hu
PDPTA
2007
14 years 8 days ago
Mobile Services Based on Client-Server or P2P Architectures facing Issues of Context-Awareness and Heterogeneous
With the advent of mobile computing and mobile services becoming more widespread and more complex, the development process of those services requires an ever more important focus o...
Robert Schmohl, Uwe Baumgarten