129 search results - page 21 / 26 » Process Variations and their Impact on Circuit Operation |
DAC
2005
ACM
13 years 9 months ago
2005
ACM
Variability of process parameters makes prediction of digital circuit timing characteristics an important and challenging problem in modern chip design. Recently, statistical stat...
DATE
2010
IEEE
14 years 13 days ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...
DATE
2008
IEEE
14 years 1 months ago
2008
IEEE
When a signal traverses on-chip voltage domains, a level shifter is required. Inverters can handle a high to low voltage shift with minimal leakage. For a low to high voltage leve...
DAC
2003
ACM
14 years 18 days ago
2003
ACM
In recent years, due to rapid advances in VLSI manufacturing technology capable of packing more and more devices and wires on a chip, crosstalk has emerged as a serious problem af...
ASPDAC
2010
ACM
13 years 5 months ago
2010
ACM
As Double Patterning Lithography(DPL) becomes the leading candidate for sub-30nm lithography process, we need a fast and lithography friendly decomposition framework. In this pape...