129 search results - page 4 / 26 » Process Variations and their Impact on Circuit Operation |
DAC
2007
ACM
14 years 8 months ago
2007
ACM
Process variation has become a critical problem in modern VLSI fabrication. In the presence of process variation, buffer insertion problem under performance constraints becomes mo...
DAC
2000
ACM
13 years 11 months ago
2000
ACM
Abstract: This paper presents a new statistical methodology to simulate the effect of both inter-die and intra-die variation on the electrical performance of analog integrated circ...
ISVLSI
2007
IEEE
14 years 1 months ago
2007
IEEE
As technology scales, more sophisticated fabrication processes cause variations in many different parameters in the device. These variations could severely affect the performance ...
DAC
2009
ACM
14 years 2 months ago
2009
ACM
This paper proposes an equation-based multi-scenario iterative robust optimization methodology for analog/mixed-signal circuits. We show that due to local circuit performance mono...
DAC
2004
ACM
14 years 8 months ago
2004
ACM
Electrothermal couplings between supply voltage, operating frequency, power dissipation and die temperature have been shown to significantly impact the energy-delay-product (EDP) ...