129 search results - page 7 / 26 » Process Variations and their Impact on Circuit Operation |
ASPDAC
2004
ACM
14 years 23 days ago
2004
ACM
- Under manufacturing process variation, a path through a fault site is called longest for delay test if there exists a process condition under which the path has the maximum delay...
VLSID
2007
IEEE
14 years 7 months ago
2007
IEEE
Leakage power is becoming a dominant contributor to the total power consumption and dual-Vth assignment is an efficient technique to decrease leakage power, for which effective de...
ASPDAC
2009
ACM
14 years 1 months ago
2009
ACM
—Considering process variability at the behavior synthesis level is necessary, because it makes some instances of function units slower and others faster, resulting in unbalanced...
MJ
2008
13 years 7 months ago
2008
Circuits optimized for minimum energy consumption operate typically in the subthreshold regime with ultra-low power-supply voltages. Speed of a subthreshold logic circuit is enhan...
MICRO
2007
IEEE
14 years 1 months ago
2007
IEEE
Process variations will greatly impact the stability, leakage power consumption, and performance of future microprocessors. These variations are especially detrimental to 6T SRAM ...