122 search results - page 14 / 25 » Process variability-aware transient fault modeling and analy... |
MICRO
2008
IEEE
14 years 1 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
ICSE
2007
IEEE-ACM
14 years 1 months ago
2007
IEEE-ACM
Software engineers tend to repeat mistakes when developing software. Automated static analysis tools can detect some of these mistakes early in the software process. However, thes...
WOSP
2000
ACM
13 years 12 months ago
2000
ACM
This paper describes the software package DSPNexpress 2000, a tool for the quantitative evaluation of systems specified in stochastic Petri nets, the Unified Modeling Language (UM...
SIGMETRICS
2010
ACM
13 years 2 months ago
2010
ACM
This paper builds a complete modeling framework for understanding user churn and in-degree dynamics in unstructured P2P systems in which each user can be viewed as a stationary al...