102 search results - page 17 / 21 » Pseudo-Exhaustive Testing of Sequential Circuits |
DFT
1999
IEEE
14 years 6 days ago
1999
IEEE
In the last decade, researchers have devoted increasing efforts to reduce the average power consumption in VLSI systems during normal operation mode, while power consumption durin...
FPGA
1995
ACM
13 years 11 months ago
1995
ACM
This paper presents a methodology for production-time testing of (uncustomized) segmented channel eld programmable gate arrays (FPGAs) such as those manufactured by Actel [1]. Th...
FMCAD
2000
Springer
13 years 11 months ago
2000
Springer
BLIF is a hardware description language designed for the hierarchical description of sequential circuits. We give a denotational semantics for BLIF-MV, a popular dialect of BLIF, t...
MSE
2003
IEEE
14 years 1 months ago
2003
IEEE
A tool has been developed to automate the testing and grading of design projects implemented in reprogrammable hardware. The server allows multiple students to test circuits in FP...
FPL
2004
Springer
14 years 1 months ago
2004
Springer
Abstract. We present an evaluation of accelerating fault simulation by hardware emulation on FPGA. Fault simulation is an important subtask in test pattern generation and it is fre...