102 search results - page 6 / 21 » Pseudo-Exhaustive Testing of Sequential Circuits |
DATE
1997
IEEE
13 years 11 months ago
1997
IEEE
A new method for state justi cation is proposed for sequential circuit test generation. The linear list of states dynamically obtained during the derivation of test vectors is use...
VLSID
1997
IEEE
14 years 2 days ago
1997
IEEE
The problem of test generation belongs to the class of NP-complete problems and it is becoming more and more di cult as the complexity of VLSI circuits increases, and as long as e...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
Abstract— Substantial attention is being paid to the fault diagnosis problem in recent test literature. Yet, the compaction of test vectors for fault diagnosis is little explored...
DATE
2003
IEEE
14 years 1 months ago
2003
IEEE
VTS
1998
IEEE
14 years 3 days ago
1998
IEEE
This paper presents a BIST architecture for Finite State Machines that exploits Cellular Automata (CA) as pattern generators and signature analyzers. The main advantage of the pro...