6251 search results - page 1192 / 1251 » Randomness, Computability, and Density |
DAC
2007
ACM
14 years 11 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
DAC
2000
ACM
14 years 11 months ago
2000
ACM
Recently, intellectual property protection (IPP) techniques attracted a great deal of attention from semiconductor, system integration and software companies. A number of watermar...
DAC
2004
ACM
14 years 11 months ago
2004
ACM
It has been widely recognized that the dynamic range information of an application can be exploited to reduce the datapath bitwidth of either processors or ASICs, and therefore th...
DAC
2005
ACM
14 years 11 months ago
2005
ACM
We present an efficient optimization scheme for gate sizing in the presence of process variations. Using a posynomial delay model, the delay constraints are modified to incorporat...
DAC
2006
ACM
14 years 11 months ago
2006
ACM
As VLSI technology scales toward 65nm and beyond, both timing and power performance of integrated circuits are increasingly affected by process variations. In practice, people oft...