135 search results - page 21 / 27 » Reducing Power Dissipation in SRAM during Test |
ISWC
1998
IEEE
13 years 12 months ago
1998
IEEE
system to date has served all of the needs of wearable computing--light weight, minimum effort, high power generation, convenient power delivery, and good power regulation. We beli...
GLVLSI
2010
IEEE
14 years 22 days ago
2010
IEEE
Clock skew variations adversely affect timing margins, limiting performance, reducing yield, and may also lead to functional faults. Non-tree clock distribution networks, such as ...
PATMOS
2000
Springer
13 years 11 months ago
2000
Springer
Abstract. The emergence of data-intensive applications in mobile environments has resulted in portable electronic systems with increasingly large dynamic memories. The typical oper...
TON
2008
13 years 7 months ago
2008
-- Internet routers and Ethernet switches contain packet buffers to hold packets during times of congestion. Packet buffers are at the heart of every packet switch and router, whic...
VTS
2006
IEEE
14 years 1 months ago
2006
IEEE
— In this paper, an algorithm for scan vector ordering, PEAKASO, is proposed to minimize the peak temperature during scan testing. Given a circuit with scan and the scan vectors,...