201 search results - page 4 / 41 » Reducing Test Application Time Through Test Data Mutation En... |
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
In this paper, we propose a new method for test access and test scheduling in NoC-based system. It relies on a progressive reuse of the network resources for transporting test dat...
QSIC
2005
IEEE
14 years 1 months ago
2005
IEEE
Database application programs typically contain program units that use SQL statements to manipulate records in database instances. Testing the correctness of data manipulation by ...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
VTS
2002
IEEE
14 years 13 days ago
2002
IEEE
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average and peak power considerations. The typical test v...