201 search results - page 7 / 41 » Reducing Test Application Time Through Test Data Mutation En... |
ICMCS
2005
IEEE
14 years 1 months ago
2005
IEEE
MPEG-4 Advanced Simple Profile video provides I, P, and B –type frames in each GOP (Group Of Pictures). To maximize the coding efficiency, it is important to determine the distr...
DATE
2003
IEEE
14 years 25 days ago
2003
IEEE
Test data compression (TDC) is a promising low-cost methodology for System-on-a-Chip (SOC) test. This is due to the fact that it can reduce not only the volume of test data but al...
NCA
2002
IEEE
13 years 7 months ago
2002
IEEE
One of the key problems in forming a smooth model from input-output data is the determination of which input variables are relevant in predicting a given output. In this paper we ...
DATE
2009
IEEE
2009
IEEE
Analyzing the impact of process variations on parametric measurements: Novel models and applications
14 years 2 months ago
Abstract—In this paper we propose a novel statistical framework to model the impact of process variations on semiconductor circuits through the use of process sensitive test stru...
ITC
2003
IEEE
14 years 24 days ago
2003
IEEE
This paper discusses the adoption of Embedded Deterministic Test (EDT) at Infineon Technologies as a means to reduce the cost of manufacturing test without compromising test quali...