387 search results - page 10 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
PVLDB
2008
13 years 7 months ago
2008
Graphs are widely used to model complicated data semantics in many applications. In this paper, we aim to develop efficient techniques to retrieve graphs, containing a given query...
ETS
2011
IEEE
12 years 7 months ago
2011
IEEE
Abstract—Networks-on-Chip (NoCs) are implicitly fault tolerant due to their inherent redundancy. They can overcome defective cores, links and switches. As a side effect, yield is...
DDECS
2007
IEEE
14 years 1 months ago
2007
IEEE
1-The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipmen...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
Existing work on testing NoC-based systems advocates to reuse the on-chip network itself as test access mechanism (TAM) to transport test data to/from embedded cores. While this m...
ISCA
2010
IEEE
13 years 12 months ago
2010
IEEE
Technology advancements have enabled the integration of large on-die embedded DRAM (eDRAM) caches. eDRAM is significantly denser than traditional SRAMs, but must be periodically r...