387 search results - page 31 / 78 » Reducing the Costs of Bounded-Exhaustive Testing |
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
This paper presents a wrapper and TAM co-optimization method for reuse of SoC functional interconnects to minimize test time under area constraint. The proposed method consists of...
VLSID
2001
IEEE
14 years 8 months ago
2001
IEEE
A technique for signature based diagnosis using windows of different sizes is presented. It allows to obtain increased diagnostic information from a given test at a lower cost, wi...
ISVC
2009
Springer
14 years 2 months ago
2009
Springer
In this paper we propose a new method for pairwise rigid point set registration. We pay special attention to noise robustness, outlier resistance and global optimal alignment. The ...
ICRA
2007
IEEE
14 years 1 months ago
2007
IEEE
— We describe the design, fabrication, and testing of an ultra-low cost Orthotweezers system for microassembly. By utilizing rapid prototyping technology, compliant mechanisms, a...
DAC
2004
ACM
13 years 11 months ago
2004
ACM
Random test generators are often used to create regression suites on-the-fly. Regression suites are commonly generated by choosing several specifications and generating a number o...