128 search results - page 20 / 26 » Relationships between Test Suites, Faults, and Fault Detecti... |
PTS
2003
13 years 8 months ago
2003
The paper studies testing based on input/output transition systems, also known as input/output automata. It is assumed that a tester can never prevent an implementation under test ...
WCET
2007
13 years 8 months ago
2007
Memory corruption is one of the most common software failures. For sequential software and multitasking software with synchronized data accesses, it has been shown that program fa...
ICCAD
2008
IEEE
14 years 4 months ago
2008
IEEE
— Three-dimensional die stacking integration provides the ability to stack multiple layers of processed silicon with a large number of vertical interconnects. Through Silicon Via...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
ASPDAC
2006
ACM
14 years 1 months ago
2006
ACM
This paper presents a case-study of delay defect screening applied to Fujitsu 2.16GHz SPARC64 microprocessor. A nonrobust delay test is used while each test vector is compacted to...