Batch-correlated failures result from the manifestation of a common defect in most, if not all, disk drives belonging to the same production batch. They are much less frequent tha...
This paper proposes a test planning method capable of reusing available processors as test sources and sinks, and the on-chip network as the access mechanism for the test of cores...
This paper introduces a new platform designed for mobile gambling services. The special characteristics of these services lead us to developed a multiservice platform that easily ...
Enrique Marcote, Daniel I. Iglesia, Carlos J. Escu...
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
Kypros Constantinides, Stephen Plaza, Jason A. Blo...
Control-Flow Integrity (CFI) is a property that guarantees program control flow cannot be subverted by a malicious adversary, even if the adversary has complete control of data m...