282 search results - page 1 / 57 » Reliability- and process-variation aware design of integrate... |
DAC
2009
ACM
14 years 12 months ago
2009
ACM
Circuit reliability is affected by various fabrication-time and run-time effects. Fabrication-induced process variation has significant impact on circuit performance and reliabilit...
DAC
2005
ACM
14 years 25 days ago
2005
ACM
A physical yet compact gate delay model is developed integrating short-channel effects and the Alpha-power law based timing model. This analytical approach accurately predicts bot...
DAC
2006
ACM
14 years 12 months ago
2006
ACM
Optical proximity correction (OPC) is one of the most widely used resolution enhancement techniques (RET) in nanometer designs to improve subwavelength printability. Conventional ...
DAC
2004
ACM
14 years 12 months ago
2004
ACM
timing analysis tools to replace standard deterministic static timing analyzers whereas [8,27] develop approaches for the statistical estimation of leakage power considering within...
ISPD
2006
ACM
14 years 4 months ago
2006
ACM
Advances in VLSI technology make clock skew more susceptible to process variations. Notwithstanding efficient zero skew routing algorithms, clock skew still limits post-manufactu...