282 search results - page 14 / 57 » Reliability- and process-variation aware design of integrate... |
DAC
2005
ACM
14 years 10 months ago
2005
ACM
Physical phenomena such as temperature have an increasingly important role in performance and reliability of modern process technologies. This trend will only strengthen with futu...
DAC
2006
ACM
14 years 3 months ago
2006
ACM
Silicon design implementation has become increasingly complex with the deep submicron technologies such as 90nm and below. It is common to see multiple processor cores, several ty...
SLIP
2009
ACM
14 years 3 months ago
2009
ACM
New technologies such as 3D integration are becoming a new force that is keeping Moore’s law in effect in today’s nano era. By adding a third dimension in current 2D circuits...
ICCD
2005
IEEE
14 years 6 months ago
2005
IEEE
As CMOS technology scales deeper into the nanometer regime, factors such as leakage power and chip temperature emerge as critically important concerns for VLSI design. This paper,...
ASPDAC
1998
ACM
14 years 1 months ago
1998
ACM
This paper presents a new design assistant for analog integrated circuits. The interactive tool is implemented in the Design Framework II of Cadence and supports the designer d...