282 search results - page 33 / 57 » Reliability- and process-variation aware design of integrate... |
HPCA
2006
IEEE
14 years 9 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
DAC
1998
ACM
14 years 10 months ago
1998
ACM
As VLSI circuit speeds have increased, reliable chip and system design can no longer be performed without accurate threedimensional interconnect models. In this paper, we describe...
DAC
2010
ACM
13 years 9 months ago
2010
ACM
We study diagnosis of segments on speedpaths that fail the timing constraint at the post-silicon stage due to manufacturing variations. We propose a formal procedure that is appli...
IPSN
2007
Springer
14 years 3 months ago
2007
Springer
— Existing sensor network architectures are based on the assumption that data will be polled. Therefore, they are not adequate for long-term battery-powered use in applications t...
MICRO
2003
IEEE
14 years 2 months ago
2003
IEEE
With increasing clock frequencies and silicon integration, power aware computing has become a critical concern in the design of embedded processors and systems-on-chip. One of the...