282 search results - page 34 / 57 » Reliability- and process-variation aware design of integrate... |
DAC
2010
ACM
14 years 28 days ago
2010
ACM
Carbon Nanotubes (CNTs) are grown using chemical synthesis, and the exact positioning and chirality of CNTs are very difficult to control. As a result, “small-width” Carbon Na...
GLVLSI
2008
IEEE
14 years 3 months ago
2008
IEEE
Statistical static timing analysis (SSTA) plays a key role in determining performance of the VLSI circuits implemented in state-of-the-art CMOS technology. A pre-requisite for emp...
ISPD
2012
ACM
12 years 4 months ago
2012
ACM
As technology scales and frequency increases, a new design style is emerging, referred to as hybrid designs, which contain a mixture of random logic and datapath standard cell com...
DAC
1999
ACM
14 years 10 months ago
1999
ACM
We propose a new VLSI layout methodology which addresses the main problems faced in Deep Sub-Micron (DSM) integrated circuit design. Our layout "fabric" scheme eliminate...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
—Increasing integrated circuit (IC) power densities and temperatures may hamper multiprocessor system-on-chip (MPSoC) use in hard real-time systems. This article formalizes the t...