282 search results - page 34 / 57 » Reliability- and process-variation aware design of integrate... |
125
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DAC
2010
ACM
15 years 8 months ago
2010
ACM
Carbon Nanotubes (CNTs) are grown using chemical synthesis, and the exact positioning and chirality of CNTs are very difficult to control. As a result, “small-width” Carbon Na...
145
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GLVLSI
2008
IEEE
15 years 10 months ago
2008
IEEE
Statistical static timing analysis (SSTA) plays a key role in determining performance of the VLSI circuits implemented in state-of-the-art CMOS technology. A pre-requisite for emp...
278
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ISPD
2012
ACM
13 years 12 months ago
2012
ACM
As technology scales and frequency increases, a new design style is emerging, referred to as hybrid designs, which contain a mixture of random logic and datapath standard cell com...
127
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DAC
1999
ACM
16 years 5 months ago
1999
ACM
We propose a new VLSI layout methodology which addresses the main problems faced in Deep Sub-Micron (DSM) integrated circuit design. Our layout "fabric" scheme eliminate...
144
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DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
—Increasing integrated circuit (IC) power densities and temperatures may hamper multiprocessor system-on-chip (MPSoC) use in hard real-time systems. This article formalizes the t...