282 search results - page 37 / 57 » Reliability- and process-variation aware design of integrate... |
CF
2004
ACM
14 years 2 months ago
2004
ACM
This paper presents a fault tolerant design technique for the clockless wave pipeline. The specific architectural model investigated in this paper is the two-phase clockless asyn...
DAC
2009
ACM
14 years 10 months ago
2009
ACM
With the thermal effect, improper analog placements may degrade circuit performance because the thermal impact from power devices can affect electrical characteristics of the ther...
ISQED
2008
IEEE
14 years 3 months ago
2008
IEEE
– As silicon technology scales, we can integrate more and more circuits on a single chip, which means more I/Os are needed in modern designs. The flip-chip technology which was ...
DAC
2005
ACM
13 years 11 months ago
2005
ACM
This paper presents a new test response compaction technique with any number of unknown logic values (X’s) in the test response bits. The technique leverages an X-tolerant respo...
FPGA
2006
ACM
14 years 20 days ago
2006
ACM
The high unit cost of FPGA devices often deters their use beyond the prototyping stage. Efforts have been made to reduce the part-cost of FPGA devices, resulting in the developmen...