282 search results - page 42 / 57 » Reliability- and process-variation aware design of integrate... |
ISLPED
2007
ACM
13 years 10 months ago
2007
ACM
Dynamic voltage scaling (DVS) is known to be one of the most efficient techniques for power reduction of integrated circuits. Efficient low voltage DC-DC conversion is a key enabl...
DAC
2009
ACM
14 years 3 months ago
2009
ACM
For a computing system to be trusted, it is equally important to verify that the system performs no more and no less functionalities than desired. Traditional testing and verifica...
DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
Ever-increasing integrated circuit (IC) power densities and peak temperatures threaten reliability, performance, and economical cooling. To address these challenges, thermal analy...
DAC
2008
ACM
14 years 10 months ago
2008
ACM
As integrated circuit technology plumbs ever greater depths in the scaling of feature sizes, maintaining the paradigm of deterministic Boolean computation is increasingly challeng...
FPGA
2009
ACM
14 years 3 months ago
2009
ACM
Aggressive scaling increases the number of devices we can integrate per square millimeter but makes it increasingly difficult to guarantee that each device fabricated has the inte...