282 search results - page 47 / 57 » Reliability- and process-variation aware design of integrate... |
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
In this paper, a simulation-based synthesis tool, AMIGO, for analog cell sizing is presented. AMIGO is based upon genetic optimization techniques adapted to circuit sizing. A fram...
DAC
2006
ACM
14 years 10 months ago
2006
ACM
Modern integrated circuits (ICs) are becoming increasingly complex. The complexity makes it difficult to design, manufacture and integrate these high-performance ICs. The advent o...
DAC
2004
ACM
14 years 10 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
ASPDAC
2006
ACM
14 years 22 days ago
2006
ACM
Thermal effects are becoming increasingly important during integrated circuit design. Thermal characteristics influence reliability, power consumption, cooling costs, and performan...
SLIP
2005
ACM
14 years 2 months ago
2005
ACM
Routability optimization has become a major concern in the physical design cycle of VLSI circuits. Due to the recent advances in VLSI technology, interconnect has become a dominan...