282 search results - page 53 / 57 » Reliability- and process-variation aware design of integrate... |
ICCAD
2009
IEEE
13 years 5 months ago
2009
IEEE
This paper accurately considers wire short defects and proposes an algorithm to guarantee IC chip yield rate improvement for redundant wire insertion. Without considering yield ra...
DAC
2005
ACM
13 years 9 months ago
2005
ACM
This paper proposes a fast decoupling capacitance (decap) allocation and budgeting algorithm for both early stage decap estimation and later stage decap minimization in today’s ...
DAC
2003
ACM
14 years 1 months ago
2003
ACM
In recent years, due to rapid advances in VLSI manufacturing technology capable of packing more and more devices and wires on a chip, crosstalk has emerged as a serious problem af...
DAC
2006
ACM
14 years 8 months ago
2006
ACM
Modern high performance processors employ advanced techniques for thermal management, which rely on accurate readings of on-die thermal sensors. As the importance of thermal effec...
DATE
2008
IEEE
14 years 2 months ago
2008
IEEE
With technology advances, the number of cores integrated on a chip and their speed of operation is increasing. This, in turn is leading to a significant increase in chip temperat...