282 search results - page 8 / 57 » Reliability- and process-variation aware design of integrate... |
DAC
2007
ACM
14 years 10 months ago
2007
ACM
This paper presents a variation resilient circuit design technique for maintaining parametric yield of design under inherent variation in process parameters. We propose to utilize...
DAC
2000
ACM
14 years 1 months ago
2000
ACM
Abstract: This paper presents a new statistical methodology to simulate the effect of both inter-die and intra-die variation on the electrical performance of analog integrated circ...
ISLPED
2010
ACM
13 years 9 months ago
2010
ACM
The unique and unpredictable nature of silicon enables the use of physical unclonable functions (PUFs) for chip identification and authentication. Since the function of PUFs depen...
GLVLSI
2009
IEEE
14 years 25 days ago
2009
IEEE
1 Soft errors caused by cosmic particles and radiation emitted by the packaging are an important problem in contemporary microprocessors. Parity bits are used to detect single bit ...
ISLPED
2006
ACM
14 years 2 months ago
2006
ACM
In this paper, we identify the key challenges that oppose subthreshold circuit design and describe fabricated chips that verify techniques for overcoming the challenges. Categorie...