The ITRS (International Technology Roadmap for Semiconductors) predicts aggressive scaling down of device size, transistor threshold voltage and oxide thickness to meet growing de...
Nanoscale multiple-valued logic systems require the development of nanometer scale integrated circuits and components. Due to limits in device physics, new components must be deve...
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
The relative tolerances for interconnect and device parameter variations have not scaled with feature sizes which have brought about significant performance variability. As we sca...
In recent years, several alternative devices have been proposed to deal with inherent limitation of conventional CMOS devices in terms of scalability at nanometer scale geometry. ...