41 search results - page 7 / 9 » Reliable Fault Diagnosis with Few Tests |
ITC
2003
IEEE
14 years 3 months ago
2003
IEEE
This paper presents an attempt of using intelligent agents for testing and repairing a distributed system, whose elements may or may not have embedded BIST (Built-In Self-Test) an...
HPCA
2006
IEEE
14 years 10 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
CASES
2011
ACM
12 years 9 months ago
2011
ACM
Cost pressure is driving vendors of safety-critical systems to integrate previously distributed systems. One natural approach we have previous introduced is On-Demand Redundancy (...
ASPLOS
2006
ACM
14 years 3 months ago
2006
ACM
Concurrency bugs are among the most difficult to test and diagnose of all software bugs. The multicore technology trend worsens this problem. Most previous concurrency bug detect...
DAC
2011
ACM
12 years 9 months ago
2011
ACM
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, ena...