29 search results - page 5 / 6 » Resistive Bridging Fault Simulation of Industrial Circuits |
CHES
2004
Springer
14 years 1 months ago
2004
Springer
Dual-rail encoding, return-to-spacer protocol and hazard-free logic can be used to resist differential power analysis attacks by making the power consumption independent of process...
VTS
2007
IEEE
14 years 2 months ago
2007
IEEE
In this paper, we identify two main bottlenecks in the functional diagnosis flow and propose new ways to overcome these. Our approach completely eliminates the “Primary Input (P...
ETS
2010
IEEE
13 years 7 months ago
2010
IEEE
ÑIn this paper, we present a comparative study on the effects of resistive-bridging defects in the SRAM core-cells, considering different technology nodes. In particular, we analy...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
SAT-based automatic test pattern generation has several advantages compared to conventional structural procedures, yet often yields too large test sets. We present a dynamic compa...
VLSID
2005
IEEE
14 years 9 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...