15 search results - page 1 / 3 » Response Surface Modeling of 100nm CMOS Process Technology u... |
VLSID
2004
IEEE
14 years 7 months ago
2004
IEEE
ISQED
2005
IEEE
14 years 1 months ago
2005
IEEE
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
With semiconductor fabrication technologies scaled below 100 nm, the design-manufacturing interface becomes more and more complicated. The resultant process variability causes a nu...
ISQED
2008
IEEE
14 years 1 months ago
2008
IEEE
Large-scale process fluctuations (particularly random device mismatches) at nanoscale technologies bring about highdimensional strongly nonlinear performance variations that canno...
WSC
2001
13 years 8 months ago
2001
Semiconductor manufacturing is generally considered a cyclic industry. As such, individual producers able to react quickly and appropriately to market conditions will have a compe...