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» Reusable test collections through experimental design
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ICCD
2006
IEEE
116views Hardware» more  ICCD 2006»
14 years 4 months ago
RTL Scan Design for Skewed-Load At-speed Test under Power Constraints
This paper discusses an automated method to build scan chains at the register-transfer level (RTL) for powerconstrained at-speed testing. By analyzing a circuit at the RTL, where ...
Ho Fai Ko, Nicola Nicolici
ICCD
2002
IEEE
122views Hardware» more  ICCD 2002»
14 years 17 days ago
Cost-Effective Concurrent Test Hardware Design for Linear Analog Circuits
Concurrent detection of failures in analog circuits is becoming increasingly more important as safety-critical systems become more widespread. A methodology for the automatic desi...
Sule Ozev, Alex Orailoglu
SIGCSE
2005
ACM
133views Education» more  SIGCSE 2005»
14 years 1 months ago
Designing, implementing, and analyzing a placement test for introductory CS courses
An introductory CS1 course presents problems for educators and students due to students’ diverse background in programming knowledge and exposure. Students who enroll in CS1 als...
Leen-Kiat Soh, Ashok Samal, Suzette Person, Gwen N...
ISMIR
2004
Springer
154views Music» more  ISMIR 2004»
14 years 29 days ago
Mapping Music In The Palm Of Your Hand, Explore And Discover Your Collection
The trends of miniaturization and increasing storage capabilities for portable music players made it possible to carry increasingly more music on small portable devices, but it al...
Fabio Vignoli, Rob van Gulik, Huub van de Wetering
ATS
2002
IEEE
110views Hardware» more  ATS 2002»
14 years 17 days ago
Test Requirement Analysis for Low Cost Hierarchical Test Path Construction
We propose a methodology that examines design modules and identifies appropriate vector justification and response propagation requirements for hierarchical test. Based on a cel...
Yiorgos Makris, Alex Orailoglu