Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
—Double patterning lithography (DPL) provides an attractive alternative or a supplementary method to enable the 32nm and 22nm process nodes, relative to costlier technology optio...
Kwangok Jeong, Andrew B. Kahng, Rasit Onur Topalog...
—This paper describes a multi-threaded parallel design and implementation of the Smith-Waterman (SM) algorithm on compute unified device architecture (CUDA)-compatible graphic pr...
This paper proposes WIDS, a wireless intrusion detection system, which applies data mining clustering technique to wireless network data captured through hardware sensors for purp...
Christie I. Ezeife, Maxwell Ejelike, Akshai K. Agg...
In this paper we present an approach to the scheduling and voltage scaling of low-power fault-tolerant hard real-time applications mapped on distributed heterogeneous embedded sys...