Abstract-Our strategy for automatic generation of functional vectors is based on exercising selected paths in the given hardware description language (HDL) model. The HDL model des...
Aggressive scaling of technology has an adverse impact on the reliability of VLSI circuits. Apart from increasing transient error susceptibility, the circuits also become more vul...
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
With the increased use of embedded/portable devices such as smart cellular phones, pagers, PDAs, hand-held computers, and CD players, improving energy efficiency is becoming a cri...
Victor Delaluz, Mahmut T. Kandemir, Narayanan Vija...