303 search results - page 13 / 61 » Robust Test Generation and Coverage for Hybrid Systems |
HASE
2007
IEEE
13 years 11 months ago
2007
IEEE
In current model-based development practice, validation that we are building a correct model is achieved by manually deriving requirements-based test cases for model testing. Mode...
DATE
2006
IEEE
14 years 1 months ago
2006
IEEE
Software-based self-test (SBST) of processors offers many benefits, such as dispense with expensive test equipments, test execution during maintenance and in the field or initiali...
KBSE
1998
IEEE
13 years 12 months ago
1998
IEEE
We report on GADGET, a new software test generation system that uses combinatorial optimization to obtain condition/decision coverage of C/C++ programs. The GADGET system is fully...
DAC
1994
ACM
13 years 11 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
ITC
1997
IEEE
13 years 12 months ago
1997
IEEE
In a fundamental paradigm shift in system design, entire systems are being built on a single chip, using multiple embedded cores. Though the newest system design methodology has s...