15 search results - page 1 / 3 » Robust gate sizing by geometric programming |
DAC
2005
ACM
14 years 7 months ago
2005
ACM
We present an efficient optimization scheme for gate sizing in the presence of process variations. Using a posynomial delay model, the delay constraints are modified to incorporat...
TCAD
2008
13 years 6 months ago
2008
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...
ICCAD
2006
IEEE
14 years 3 months ago
2006
IEEE
An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU robustne...
ISQED
2010
IEEE
13 years 9 months ago
2010
IEEE
Circuit design under process variation can be formulated mathematically as a robust optimization problem with a yield constraint. Existing methods force designers to either resort...
ISQED
2005
IEEE
14 years 15 days ago
2005
IEEE
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...