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» Robust gate sizing by geometric programming
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VTS
2006
IEEE
101views Hardware» more  VTS 2006»
14 years 27 days ago
Design Optimization for Robustness to Single Event Upsets
Abstract: An optimization algorithm for the design of combinational circuits that are robust to single-event upsets (SEUs) is described. A simple, highly accurate model for the SEU...
Quming Zhou, Mihir R. Choudhury, Kartik Mohanram
GLVLSI
2006
IEEE
185views VLSI» more  GLVLSI 2006»
14 years 29 days ago
Application of fast SOCP based statistical sizing in the microprocessor design flow
In this paper we have applied statistical sizing in an industrial setting. Efficient implementation of the statistical sizing algorithm is achieved by utilizing a dedicated interi...
Murari Mani, Mahesh Sharma, Michael Orshansky
STOC
1997
ACM
122views Algorithms» more  STOC 1997»
13 years 11 months ago
Fault-Tolerant Quantum Computation With Constant Error
Shor has showed how to perform fault tolerant quantum computation when the probability for an error in a qubit or a gate, η, decays with the size of the computation polylogarithmi...
Dorit Aharonov, Michael Ben-Or
ICCAD
2004
IEEE
155views Hardware» more  ICCAD 2004»
14 years 3 months ago
Robust analog/RF circuit design with projection-based posynomial modeling
In this paper we propose a RObust Analog Design tool (ROAD) for post-tuning analog/RF circuits. Starting from an initial design derived from hand analysis or analog circuit synthe...
Xin Li, Padmini Gopalakrishnan, Yang Xu, Lawrence ...
ICCAD
2006
IEEE
127views Hardware» more  ICCAD 2006»
14 years 3 months ago
Joint design-time and post-silicon minimization of parametric yield loss using adjustable robust optimization
Parametric yield loss due to variability can be effectively reduced by both design-time optimization strategies and by adjusting circuit parameters to the realizations of variable...
Murari Mani, Ashish Kumar Singh, Michael Orshansky