This paper presents a method to automatically generate posynomial response surface models for the performance parameters of analog integrated circuits. The posynomial models enabl...
Walter Daems, Georges G. E. Gielen, Willy M. C. Sa...
We present a new technique to examine the trade-off regions of a circuit where its competing performances become “simultaneously optimal”, i.e. Pareto optimal. It is based on ...
Efficient system-level design is increasingly relying on hierarchical design-space exploration, as well as compositional methods, to shorten time-to-market, leverage design re-use...
As technology continues to scale beyond 100nm, there is a significant increase in performance uncertainty of CMOS logic due to process and environmental variations. Traditional c...
Dinesh Patil, Sunghee Yun, Seung-Jean Kim, Alvin C...
We present an efficient optimization scheme for gate sizing in the presence of process variations. Our method is a worst-case design scheme, but it reduces the pessimism involved i...
Jaskirat Singh, Zhi-Quan Luo, Sachin S. Sapatnekar