768 search results - page 101 / 154 » Robustness of Sequential Circuits |
ATS
2005
IEEE
14 years 2 months ago
2005
IEEE
In this paper, we propose an oscillation-based test methodology for sequential testing. This approach provides many advantages over traditional methods. (1) It is at-speed testing...
GLVLSI
2005
IEEE
14 years 2 months ago
2005
IEEE
As timing requirements in today’s advanced VLSI designs become more aggressive, the need for automated tools to diagnose timing failures increases. This work presents two such a...
ASPDAC
2004
ACM
14 years 2 months ago
2004
ACM
Abstract— In this paper we enhance the performance of multicycle path analysis in an industrial setting. Industrial designs are, in general, more complicated, but contain more in...
DATE
2003
IEEE
14 years 2 months ago
2003
IEEE
Interconnect delay dominates system delay in modern circuits, and with reduced feature sizes, coupling capacitance and signal crosstalk have become significant issues. By spacing...
MSE
2003
IEEE
14 years 2 months ago
2003
IEEE
A tool has been developed to automate the testing and grading of design projects implemented in reprogrammable hardware. The server allows multiple students to test circuits in FP...