768 search results - page 108 / 154 » Robustness of Sequential Circuits |
DATE
2006
IEEE
14 years 2 months ago
2006
IEEE
In this paper, we propose a timing-reasoning algorithm to improve the resolution of delay fault diagnosis. In contrast to previous approaches which identify candidates by utilizin...
ASPDAC
2007
ACM
14 years 21 days ago
2007
ACM
Power supply noise increases the circuit delay, which may lead to performance failure of a design. Decoupling capacitance (decap) addition is effective in reducing the power suppl...
BC
2008
13 years 8 months ago
2008
Abstract This paper presents a simple yet biologicallygrounded model for the neural control of Caenorhabditis elegans forward locomotion. We identify a minimal circuit within the C...
ICCAD
2010
IEEE
13 years 6 months ago
2010
IEEE
Coarse-grain multi-threshold CMOS (MTCMOS) is an effective power-gating technique to reduce IC's leakage power consumption by turning off idle devices with MTCMOS power switc...
ET
2010
13 years 7 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...