768 search results - page 13 / 154 » Robustness of Sequential Circuits |
DSD
2007
IEEE
14 years 2 months ago
2007
IEEE
Similar to sequential test pattern generation, the problem of identifying untestable faults in sequential circuits remains unsolved. Most of the previous works in untestability id...
DATE
1998
IEEE
14 years 25 days ago
1998
IEEE
A new approach for sequential circuit test generation is proposed that combines software testing based techniques at the high level with test enhancement techniques at the gate le...
DATE
1997
IEEE
14 years 24 days ago
1997
IEEE
The paper proposes a novel approach in an attempt to solve the test problem for sequential circuits. Up until now, most of the classical test pattern techniques use a number of al...
ET
2000
13 years 8 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
ATS
2000
IEEE
14 years 1 months ago
2000
IEEE
At very high frequencies, the major potential of asynchronous circuits is absence of clock skew and, through that, better exploitation of relative timing relations. This paper pre...